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Verzeichnis der Publikationen vor 2005

2005 | 2004 | 2003 | 2002 | 2001 | 2000 | 1999 | 1998 | 1997 | 1996 | 1995 | 1994 | 1993 | 1992 |

• H. Rothe:

Miniaturisierte autonome rekonfigurierbare Sensornetze oder "Das Konzept der freundlichen Umgebung", Vortrag auf dem BMVg, 17.11.2005, Bonn.

•  Rothe, H.; Usbeck, A.; Cibis, D.; Krüger, K.:

Characterisation of drop-on-demand printed conductive silver tracks, SPIE-Conference "Advanced Characterisation Techniques for Optics, Semiconductors and Nanotechnologies II", San Diego/USA, 02.-04.08.2005

•  Kuhrt, A.; Rothe, H.:

direct fire solution - update and test-results , NAAG LG/4 SG/2 Sharable Fire Control Software Suite NATO Armaments Ballistics Kernel Review, Aberdeen, USA, September 2005.

•  Hüser, D.:

Untersuchungen zur Koordinatenmesstechnik für Mikrosysteme in zweieinhalb Dimensionen, Habilitationsschrift, Helmut-Schmidt-Universität , Shakerverlag, ISBN 3-8322-4409-3 , Hamburg, Germany, September 2005.

•  Groh, Ch.; Rothe, H.:

Remote online processing of multispectral image data, SPIE International Symposium on Optical Systems Design 2005 , Jena, Germany, September 2005.

•  Groh, Ch.; Rothe, H.:

Multispectral Image Classification focussing on Transmission Paths with limited Bandwith, SPIE 12th International Symposium on Remote Sensing , Bruges, Belgium, September 2005.

•   Rothe, H.; Kuhrt, A.; Schröder, S.; Trebing, S.:

Fire Control Algorithm and Software for the modular naval artillery concept (MONARC) of the German Navy, Computational Ballistics 2005 , Cordoba, Spain, 2005.

•   Kuhrt, A.; Rothe, H.:

The Use of Computer Algebra and non-linear Optimisation for realtime Computation of Fire Orders for direct fire, Computational Ballistics 2005 , Cordoba, Spain, 2005.

•   Rothe, H.; Kuhrt, A.:

Feuerleitalgorithmus und Software für das MONARC-Projekt der deutschen Marine, UniForschung, HSU/UniBwH , Hamburg, Deutschland, 2005.

•   Rothe, H.; Winkler, R.:

Analysis of similarities and differences in programming of Coordinate Measuring Machines (CMM’s) and the Nanometer Coordinate Measuring Machine (NCMM), 4th Sino-German Symposium on Micro and Nano Technologies April 18 to 20, 2005, Vieweg Building, Room 133, PTB, Braunschweig, Germany, 2005.

•   Rothe, H.; Schröder, S.:

Verfahren zur Ermittlung einer Feuerleitlösung , Patent, angemeldet am 17.05.2005 durch Kraus-Maffei-Wegmann GmbH & Co. KG , 2005.

•   C. Hahlweg, H. Rothe:

Calibration procedures and measurement results of a fast semi-hemispherical spectro-radiometer in VIS and NIR, in SPIE Imaging Spectrometry X, Proc. SPIE Vol. 5546, 2004.

•   C. Hahlweg, H. Rothe:

Design of a semi-hemispherical spectro-radiometer for fast acquisition of BRDF libraries in VIS and NIR, in SPIE Imaging Spectrometry X, Proc. SPIE Vol. 5546, 2004.

•   H. Rothe:

Miniaturisierte optronische Sensoren und Wirksysteme für Mini-UAV, in INT Brainstorming Workshop 2004, Fraunhofer Institut für Naturwissenschaftlich-technische Trendanalysen, Euskirchen 09./10. 11. 2004.

•   H. Rothe:

Reliability of CONVEX and HP systems in the last 15 years - a customer's synopsis, in Hewlett Packard's Consortium on Advanced Scientific and Technical Computing, Pittsburgh, PA, October 2004.

•   U. Schael, H. Rothe:

New pixel-oriented simulation for 3D laser radar. In Optics and Photonics in Security and Defense, Proc. SPIE 5612-41, London, 26.-27. 10. 2004.

•   U. Schael, H. Rothe:

Erweiterte Simulation für augensicheres, bildgebendes 3D Laser Radar, Dissertation, Schriftenreihe Laboratorium Mess- und Informationstechnik Prof. Dr.-Ing. habil H. Rothe (Hrsg.) Band 2, SHAKER-Verlag, Laboratorium Mess-und Informationstechnik, Helmut Schmidt Universität- Universität der Bundeswehr, Hamburg, April 2004.

•   D. Hüser and R. Petersen and H.Rothe:

Coordinate Measurements in Microsystems by using AFM-probing: Problems and Solutions, in PTB-Bericht Proceedings of the 6th Seminar on Quantitative Microscopy and 2st Seminar on Nanoscale Calibration Standards and Methods. NanoScale 2004 - Dimensional measurements in the micro- and nanometre range, eds.: K. Hasche, W. Mirande, and G. Wilkening, Braunschweig, März 2004.

•   H. Rothe, U. Schleicher:

Verfahren und Vorrichtung zur Bestimmung der absoluten Windgeschwindigkeit, Patentschrift angemeldet von "Diehl Munitionssysteme GmbH & Co. KG", D 2004/20, 20.02. 2004.

•   R. Petersen, H. Rothe:

Theoretische und experimentelle Untersuchungen zur Koordinatenmesstechnik in der Nanametrologie, Dissertation, Schriftenreihe Laboratorium Mess- und Informationstechnik, Prof. Dr.-Ing. habil. H. Rothe (Hrsg.) Band 1, SHAKER-Verlag, ISBN 2-8322-2551-X, Laboratorium Mess-und Informationstechnik, Helmut Schmidt Universität- Universität der Bundeswehr, Hamburg, Dezember 2003.

•   U. Schael, H. Rothe:

Simulation of eye-save imaging laser radar for advanced range estimation and improveddesign process using VRML. No. 5189-18 in Proceedings SPIE, Surface Scattering and Diffraction III, eds.: Z. Gu, A. Maraduduin, San Diego, August 2003.

•   H. Rothe, C. Hahlweg:

Estimation of performance limits of multi-pole method using parallelcomputing techniques. No. 5189-16 in Proceedings SPIE, Surface Scattering and Diffraction III, eds.: Z. Gu, A. Maraduduin, San Diego, August 2003.

•   H. Rothe, T. Rinder:

Developing review of an angle resolved light scatter sensor. No. 5189-14 in Proceedings SPIE, Surface Scattering and Diffraction III, eds.: Z. Gu, A. Maraduduin, San Diego, August 2003.

•   C. Hahlweg, H. Rothe:

Deducing light scatter from AFM-measurements. No. 5189-12 in Proceedings SPIE, Surface Scattering and Diffraction III, eds.: Z. Gu, A. Maraduduin, San Diego, August 2003.

•   T. Rinder, H. Rothe:

Localization of sub-100-nm particles on wafers with solid state detector arrays. No. 5188-35 in Proceedings SPIE, Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies, eds.: A. Duparré, B. Singh, San Diego, August 2003.

•   R. Petersen, H. Rothe:

One way to accomplish the advanced requests of nanometrology: The Nanometer Coordinate Measuring Machine (NCMM). No. 5188-29 in Proceedings SPIE, Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies, eds.: A. Duparré, B. Singh, San Diego, August 2003.

•   R. Petersen, H. Rothe, J. Stover:

The Nanometer Coordinate Measuring Machine (NCMM): AFM-scans in millimeter range without stitching procedures. Proceedings of Seeing at the Nanoscale. Conference of California NanoSystems Institute (CNSI), Albany NanoTech, and Veeco Instruments. Santa Barbara, August 2003.

•   U. Schael and H. Rothe:

Advanced simulation for eye-safe, imaging laser radar for range estimation, system comparison and design process. No. 5144-33 in Proc. SPIE, Optical Measurement Systems for Industrial Inspection III, eds.: W. Osten, München, Juni 2003.

•   Gruhlke, M.; Rothe, H.
Computer Aided Thermal Analysis of a Technology Demonstration Satellite (NPSAT1) Externer Link: Computer Aided Thermal Analysis of a Technology Demonstration Satellite (NPSAT1) (http://www.stormingmedia.us/98/9853/A985314.html?searchTerms=~Gruhlke), NAVAL POSTGRADUATE SCHOOL MONTEREY CA SPACE SYSTEMS ACADEMIC GROUP , May 2003.

•   R. Petersen and H. Rothe:
A milestone in nanometrology: Large area AFM-scans with the Nanometre Coordinate Measuring Machine (NCMM), in Proceedings – Vol. 2 of euspen International Topical Conference on Precision Engineering, Micro Technology, Measurement Techniques and Equipment, eds.: M. Weck and H. Kunzmann, Aachen, Mai 2003

•   U. Schael und H. Rothe:
Einsatz eines augensicheren, laserbasierten Messsystems mit 1574nm Wellenlänge zur Objektdetektion im km-Bereich, in tm - Technisches Messen 69 (2002) 9, Oldenbourg Verlag, S. 381-389. September 2002. (http://www.tm-messen.de) Externer Link: (http://www.tm-messen.de) (http://www.tm-messen.de) Link wird in einem neuen Fenster geöffnet

•   T. Rinder and H. Rothe:
Modeling of an ARS sensor system in spatial and time domain. No. 4780-16 in Proc. SPIE, Surface Scattering and Diffraction for Advanced Metrology II, eds.: Z.-H. Gu and A.A. Maradudin, Seattle, Juli 2002.

•   U. Schael and H. Rothe:
Advanced system model for 1574-nm imaging, scannerless, eye-safe laser radar. No. 4780-15 in Proc. SPIE, Surface Scattering and Diffraction for Advanced Metrology II, eds.: Z.-H. Gu and A.A. Maradudin, Seattle, Juli 2002.

•   T. Rinder and H. Rothe:
Performance limits of ARS sensors based on CMOS photodiode arrays. No. 4779-12 in Proc. SPIE, Advanced Characterization Techniques for Optics, Semiconductor, and Data Storage Components, eds.: A. Duparré and B. Singh, Seattle, Juli 2002.

•   R. Petersen, H. Rothe, and D. Hüser:
Large AFM scans with a Nanometer Coordinate Measuring Machine (NCMM). No. 4779-10 in Proc. SPIE, Advanced Characterization Techniques for Optics, Semiconductor, and Data Storage Components, eds.: A. Duparré and B. Singh, Seattle, Juli 2002.

•   U. Schael and H. Rothe:
3D-range images with high depth resolution from 1574nm scannerless, eye-safe laser radar. Proc. VDI 1694, International Symposium on Photonics in Measurement, pp. 317-326, eds.: T. Pfeifer and W. Holzapfel, Aachen, Juni 2002.

•   T. Rinder and H. Rothe:
Detection of particle contamination on silicon wafers based on light scattering techniques. Proc. VDI 1694, International Symposium on Photonics in Measurement, pp. 143-148, eds.: T. Pfeifer and W. Holzapfel, Aachen, Juni 2002.

•   A. Müller, A. Keil, H. Rothe, R. Petersen:
The Dynamics of a Nanometer Coordinate Measuring Machine-Case Study of a Mechatronic System, Proc. International Symposiom on Mechatronics (ISOM), pp. 393-404, Chemnitz, März 2002.

•   R. Petersen, H. Rothe, and D. Hüser:
Large area AFM-scans with the Nanometer Coordinate Measuring Machine. PTB-Bericht No PTB-F-44 in Proceedings of the 5th Seminar on Quantitative Microscopy and 1st Seminar on Nanoscale Calibration Standards and Methods. NanoScale 2001 - Dimensional measurements in the micro- and nanometre range, eds.: K. Hasche, W. Mirande, and G. Wilkening, Bergisch Gladbach, Nov. 2001.

•   A. Müller and H. Rothe:
Optimization of controller parameter of a coordinate measuring machine. in Proc. 6. US national congress on computational mechanics (USNCCM), p. 386, Dearborn, Detroit, 2001.

•   U. Schael and H. Rothe:
Influence of target surface and speckles for eye-safe, scannerless, imaging laser radar. No. 4447-12 in Proc. SPIE, Surface Scattering and Diffraction for Advanced Metrology, pp. 87-97, eds.: Z.-H. Gu and A.A. Maradudin, San Diego, August 2001.

•   T. Rinder and H. Rothe:
Metrological characterization of an ARS sensor based on an elliptical mirror system and a calibrated CMOS photo detector array. No. 4447-09 in Proc. SPIE, Surface Scattering and Diffraction for Advanced Metrology, pp. 53-64, eds.: Z.-H. Gu and A.A. Maradudin, San Diego, August 2001.

•   U. Schael and H. Rothe
Field measurements with 1574nm imaging, scannerless, eye-safe laser radar. No 4377-01 in Proc. SPIE, Laser Radar Technology and Application VI, pp. 1-11, eds.: G. W. Kamerman, Orlando, April 2001.

•   R. Petersen and H. Rothe:
Development problems of a Nanometer Coordinate Measuring Machine (NCMM). No. 4100-30 in Proc. SPIE, Scattering and Surface Roughness III, eds.: Z.-H. Gu and A.A. Maradudin, San Diego, Aug. 2000.

•   T. Rinder and H. Rothe:
Design problems of calibrated BRDF sensors: dynamic range, speed, angle of view. No. 4100-18 in Proc. SPIE, Scattering and Surface Roughness III, eds.: Z.-H. Gu and A.A. Maradudin, San Diego, Aug. 2000.

•   D. Hüser and H. Rothe:
AFM data analysis: Separating surface microtopography from instrumental artifacts. No. 4100-20 in Proc. SPIE, Scattering and Surface Roughness III, eds.: Z.-H. Gu and A.A. Maradudin, San Diego, Aug. 2000.

•   T. Rinder and H. Rothe:
Surface identification using angle resolved light scatter measurements. IEEE-INNS-ENNS International Joint Conference on Neural Networks, Como, Juli 2000.

•   T. Rinder and H. Rothe:
Angle resolved - light scatter measurements for the surface parameter identification. Proceedings of the X. International Colloquium on Surfaces, pages  310 - 321, Chemnitz, Feb. 2000.

•   D. Hüser, H. Rothe, and R. Petersen:
Recognizing Objects in Dimensional Micro-Metrology. PTB-Bericht No PTB-F-39 in Proceedings of the 4th Seminar on Quantitative Microscopy: Dimensional measurements in the micro- and nanometre range - applications - challenges - state-of-the-art -, eds.: K. Hasche, W. Mirande, and G. Wilkening, Semmering, Jan. 2000.

•   H. Rothe, D. Hüser, and R. Petersen:
Simulation of the dynamic behaviour of a Nanometer Coordinate Measuring Machine. PTB-Bericht No PTB-F-39 in Proceedings of the 4th Seminar on Quantitative Microscopy: Dimensional measurements in the micro- and nanometre range - applications - challenges - state-of-the-art -, eds.: K. Hasche, W. Mirande, and G. Wilkening, Semmering, Jan. 2000.

•   T. Rinder and H. Rothe:
Characterization of surfaces using neural pattern recognition methods based on BRDF and AFM measurements. No. 3784B-15 in Proc. SPIE, Scattering and Surface Roughness III, Denver, Juli 1999.

•   H. Rothe, D. Hüser, A. Kasper, and T. Rinder:
Derivation of BRDF from smooth surface topography of  large AFM scans - investigation of the influences of surface figures and AFM artefacts. No. 3784B-21 in Proc. SPIE, Scattering and Surface Roughness III, Denver, Juli 1999.

•   D. Hüser, T. Rinder, A. Kasper and H. Rothe:
Investigations of smooth surfaces by measuring the BRDF with stray light sensor in comparison with PSD curves evaluated from topography of large AFM scans. No. 3619 in Proc. SPIE, Surface Characterization for Computer Disks, Wafers, and Flat Panel Displays, p. 121,  San Jose, Januar 1999.

•   D. Hüser and H. Rothe:
Robust averaging of signals for triangulation sensors. Meas. Sci. Technol. 9, p. 1017, 1998.

•   D. Hüser and H. Rothe:
Korrektur der Metrik von Rastersondenmikroskopen. Sensoren und Messtechnik,VDE-Verlag, ed., no. 148 in ITG-Fachbericht, 1998. (nauheimpaper.ps.gz)

•   A. Kasper and H. Rothe:
Evaluation of in-situ ARS sensors for characterizing smooth and rough surfaces. No. 3426-27 in Proc. SPIE, Scattering and Surface Roughness II, p.252, San Diego 1998.

•   D. Hüser, T. Rinder, and H. Rothe:
Comparison of PSD measurements using stray light sensors with PSD curves evaluated from topography of large AFM scans. No. 3426-47 in Proc. SPIE, Scattering and Surface Roughness II, p.262, San Diego 1998.

•   D. Hüser and H. Rothe:
Methods to Recognize Artefacts of AFM measurements as instrumental errors, In Proceedings of the 3nd Seminar on Quantitative Microscopy: Geometrical measurements in the micro- and nanometer range with far and near field methods, No. PTB-F-34 in PTB-Bericht, Nov. 1998.

•   H. Rothe:
Approaches to Pattern Recognition, in Advanced Pattern Recognition Techniques, RTO Lecture Series 214, RTO-EN-2 AC/323 (SET) TP/1, 1998.

•   H. Rothe, A. von der Fecht, A. Kasper and T. Rinder:
Practical Application of Pattern Recognition Techniques, in Advanced Pattern Recognition Techniques, RTO Lecture Series 214, RTO-EN-2 AC/323 (SET) TP/1, 12(1)-12(25), 1998.

•   A. von der Fecht and H. Rothe:
Bildgebendes, augensicheres 3D Laser Radar basierend auf Range Gating. 99. Tagung der DGaO, P34, p. 118, 1998.

•   A. von der Fecht and H. Rothe:
Comparison of imaging laser radars based on range gating under different weather conditions. No. 3380 in Proc. SPIE, Laser Radar Technology and Applications III, 1998.

•   D. Hüser and H. Rothe:
Intelligent triangulation sensors -- independent of measuring objects's properties. Progress in Precision Engineering and Nanotechnology, H. K. et al., ed., no. ISBN 3-9801433-9-2. In Proc. of the 4th Int. Conf. UME, 1997.

•   D. Hüser and H. Rothe:
Calibrating SPM with grid structures using statistically and geometrically obtained transformation functions. In Proceedings of the 2nd Seminar on Quantitative Microscopy: Geometrical measurements in the micro- and nanometer range with far and near field methods, No. PTB-F-30 in PTB-Bericht, Nov. 1997. (wienpaper.ps.gz)

•   A. von der Fecht and H. Rothe:
Augensicheres 3D Laser Radar zur Kollisionsvermeidung, in Schiff & Hafen No. 50, pp. 39-41,1997.

•   A. von der Fecht and H. Rothe:
Imaging laser radar simulation software and experiments for enhanced and synthetic vision system design. in Proc. SPIE No. 3065, Laser Radar Technology and Applications II, 1997

•   H. Rothe and D. Hüser:
Application of circular and spherical statistics for the interpretation of BRDF-measurements. Scattering and Surface Roughness, Z.-H. Gu and A. Maradudin, eds., no. 3141-02 in Proc. SPIE, 1997.

•   H. Rothe and D. Hüser:
Statistical estimators of spatial vector fields in defect classification and texture modeling of high tech surfaces. No. 3167-08 in Proc. SPIE, 1997.

•   Rothe, H., Kasper, A., Wienecke, K.-H.:
Fast and accurate roughness characterization techniques for wafers and hard disks. Proc. SPIE 2862-06, SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 4 - 9 August 1996, Denver, CO.

•   Ginter, O., Rothe, H.:
Desktop setup for binary holograms. SPIE/EUROPTO Conference on Design and Engineering of Optical Systems, Proc. SPIE No. 2727-74,pp.709-719, 13. - 16. Mai 1996, Glasgow, UK.

•   Brandt, O., Rothe, H., Kasper, A.:
Quality Control of Thermal Sprayed Coatings with an Optoelectronic BRDF-Sensor. 8th National Thermal Spray Conference, 11 - 15 September 1995, Houston, Texas.

•   Rothe, H.:
Multivariate estimation of the systematic error of scanning probe microscopes. Thin Solid Films, 264(1995) 282 - 290.

•   Rothe, H., Kasper, A.:
Is there any significant correlation between roughness and scattering near the Rayleigh-limit? SPIE's International Symposium on Optical Science, Engineering and Instrumentation, Proc. SPIE No. 2541-20, 9 - 14 July 1995, San Diego, California.

•   Rothe, H., Riedel, P.:
Defekt-Klassifizierungs-Gerät. Patentschrift DE 43 21 042 C 1, Erteilungstag 15.09. 1994.

Separation of Roughness from Defects on Smooth Metal and Glass Surfaces. Proc. of the 3rd Int. Conf. on Ultraprecision in Manufacturing Engineering, eds. M. Weck and H. Kunzmann, May 1994, Aachen, pp. 7 -10.

•   Rothe, H., Duparré, A.:
The Principal Surface Approach as Means of Precise rms-Roughness Estimation in Noncontact Profilometry. Proc. SPIE No. 2263 (1994).

•   Rothe, H., Ginter, O.:
Principal Component Filtering of Single-Shot Laser Radar Signals. Proc. SPIE No. 2271 (1994).

•   Rothe, H., Riedel, P., and Specht, O.:
BRDF Sensing with Fiber Optics, Programmable Laser Diodes and High Resolution CCD Arrays. Proc. SPIE No. 2260 (1994).

•   Rothe, H., Duparré, A., Jacobs, S.:
Generic Detrending of Surface Profiles. Optical Engineering, Vol. 33, No. 9, pp. 3023 - 3030, (1994).

•   Rothe, H., Woldenga, C.:
CAQ mit multivariaten statistischen Methoden. Qualität und Zuverlässigkeit 39, Heft 3, pp. 274 - 278, Carl Hanser Verlag München, 1994.

•   Rothe, H., Ginter, O., Woldenga, C.:
Assessment and Robust Reconstruction of Laser Radar Signals. Optics and Laser Technology, Vol. 25, No. 5, pp. 289 - 297, (1993)

•   Rothe, H., Truckenbrodt, H.:
Real-Time Defect Detection using Multi-Aperture Fiber Optic Sensors and Machine Learning. International EUROPTO/SPIE Symposium on Electronic Imaging and Device Engineering, Munich, Proc. SPIE No. 1989 (1993), eds. V. Gerbig and W. E. Haas.

•   Rothe, H., Truckenbrodt, H.:
Real-Time Detection of Surface Damage by Direct Assessment of the BRDF. SPIE's International Symposium on Optics, Imaging and Instrumentation, San Diego, Proc. SPIE No. 1995 (1993), ed. R. Stover.

•   Rothe, H., Truckenbrodt, H.:
Laser Triangulation near the Diffraction Limit. International Journal of Optoelectronics, Vol. 8, Nos. 5/6, pp. 655 - 667, (1993).

•   Mager,P.P., Triggle, D., Rothe, H.:
QSAR, Diagnostic Statistics and Molecular Modelling of 1,4-Dihydrophenone Calcium Antagonists: A difficult Road ahead. Drug Design and Discovery, UK, 1992, Vol. 8, pp. 273-289.

•   Rothe, H., Türschmann, M., Mager, P.P., Endter, R.:
Improved Accuracy in Laser Triangulation by Variance-Stabilizing Transformations. Optical Engineering, USA, July 1992, Vol. 31, No. 7, pp. 1538-1545.

•   Rothe, H., Boudon, S.:
An Approach to Knowledge-Based QSAR Predictions Using the MASCA Model. 9th European Symposium on Structure-Activity Relationships: QSAR and Molecular Modelling. Trends in QSAR and Molecular Modeling '92, ESCOM SCIENCE PUBLISHRS B.V., Leiden, Netherlands.

•   Rothe, H., Truckenbrodt, H.:
Discrimination of Surface Properties Using BRDF-Variance Estimators as Feature Variables. International EUROPTO/SPIE Symposium on Optical Systems Design, Proc. SPIE No. 1781 (1992), ed. L. Baker, pp. 152-162.

•   Pfeifer,T., Evertz, J., Tutsch, R., Rothe, H.:
Testing Aspherics without rotational Symmetry using a Fizeau Interferometer with Computer generated Holograms. International EUROPTO/SPIE Symposium on Optical Systems Design, Proc. SPIE No. 1781 (1992), ed. L. Baker, pp. 216-223.

Fachvorträge (Auswahl)

• H. Rothe and A. Müller:
Distributed Optimization of Mechatronics Systems - Transition from V-Class to Superdome. Vortrag auf der HPCUG (High Performance Computer Users Group), 17.-21.03.2001, San Mateo, USA.

• Hüser, D., Rinder T., and Rothe, H.:
Vergleich der aus Topographiemessungen glatter Oberflächen berechneten Streulichtverteilungen mit den Streulichtmessungen in der Rayleigh-Rice-Näherung. Vortrag B9, 100. Jahrestagung der DGaO, 25.05. - 29.05. 1999, Berlin, Germany.

A. Kasper, T. Rinder, and H. Rothe:
Charakterisierung von technischen Oberflächen mittels hochauflösender Streulichtmessung. Vortrag auf DFG-Kolloquium im Schwerpunktprogramm Automatische Sichtprüfung technischer Objekte, 01.03.1999, Erlangen, Germany

A. Kasper and H. Rothe:
Schnelle Streulichtsensoren für die Oberflächencharakterisierung, Vortrag auf DFG-Kolloquium im Schwerpunktprogramm Automatische Sichtprüfung technischer Objekte, 16.02.1998, Bremen, Germany

A. Kasper and H. Rothe:
Schnelle Streulichtsensoren für die Oberflächencharakterisierung, Vortrag auf DFG-Kolloquium im Schwerpunktprogramm Automatische Sichtprüfung technischer Objekte, 16.02.1998, Bremen, Germany

Rothe, H., Kasper, A., Rauchfuß, J.:
Faseroptische Sensoren mit hunderten Einzelfasern und direkter Smart-Sensor-Kopplung. Vortrag A81, 97. Jahrestagung der DGaO, 28.05. - 01.06. 1996, Neuchâtel, Schweiz.

Mahnke, I., Kasper, A., Rothe, H.:
Automatische Generierung von Terrains aus DTED und DFAD-Daten. VR-World, 13. - 15.02 1996, Stuttgart.

Rothe, H., Kasper, A.:
Gleichzeitige Prüfung von Form und RMS-Rauheit mittels Laser-Triangulation. Laser 95, München, Kongreß Optische Meßtechnik, 19. - 23. Juni 1995.

Rothe, H., Kasper, A.:
Untersuchungen zur Eignung faseroptischer Streulichtsensoren für das Qualitätsmanagement in der Optikfertigung. Poster auf der Jahrestagung der Deutschen Gesellschaft für angewandte Optik, 7. - 10. Juni 1995, Binz auf Rügen.

Rothe, H.:
Bewertung statistischer Verfahren für das Qualitätsmanagement in der Optikfertigung. Hauptvortrag auf der Jahrestagung der Deutschen Gesellschaft für angewandte Optik, 7. - 10. Juni 1995, Binz auf Rügen.

Rothe, H., Kasper, A.:
FOSSIL - an intelligent fiber optic stray light sensor system with integrated laser source. Poster auf der Sensor '95, 20. - 22. Mai 1995, Nürnberg.

Rothe, H.:
Konversion von militärischer zu ziviler Technologie - eine Herausforderung nur für Ingenieure? Vortrag anläßlich der Immatrikulation des Studentenjahrgangs 1994 am 13. Oktober 1994, Universität der Bundeswehr Hamburg.

Rothe, H.:
Multivariate Schätzung des systematischen Fehlers von Rastersondenmikroskopen. Workshop SXM1, 4. - 7.10.1994, Münster.

Rothe, H.:
Meß- und Informationstechnik: Synergisten? Akademische Antrittsvorlesung am 30.06. 1994, Universität der Bundeswehr Hamburg.

Rothe, H., Kasper, A., Specht, O.:
Hochauflösende CCD-Matrixkameras für die metrische Bildverarbeitung. OPTO 94, Bildverarbeitung I, Leipzig, 17.05. - 19.05. 1994.

Rothe, H., Türschmann, M.:
High-Precision Laser Triangulation by Speckle Decorrelation. Laser '93/Kongreß B - Optische Meßtechnik, 21.-26. Juni 1993, München.

Rothe, H., Truckenbrodt, H., Türschmann, M.:
Varianzstabilisierte Lasertriangulation. Jahrestagung der Deutschen Gesellschaft für angewandte Optik 1993, 2. Juni - 5. Juni 1993, Wetzlar.

Rothe, H., Truckenbrodt, H.:
Echtzeit-Detektion von Oberflächendefekten durch direkte Bewertung der BRDF. Jahrestagung der Deutschen Gesellschaft für angewandte Optik 1993, 2. Juni - 5. Juni 1993, Wetzlar.

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